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Lower scale of some random-value tests

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The random-value tests can be pathological, and in particular, the
test of arbitrarily-spaced values is in effect O(N^2), and with race
testing on, that test *alone* can take ten minutes to run, but
it's not really all that exciting. We just reduce a bunch of values
and/or test fewer things for these, which doesn't significantly alter
coverage, but reduces test runtime on my laptop with `-race` from
21 minutes to a bit under 5.
This commit is contained in:
Seebs 2020-06-05 12:09:40 -05:00
parent 0a17b3713c
commit 55ff03a2d6
2 changed files with 13 additions and 10 deletions
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5
roaring/naive_test.go
View file

@ -15,6 +15,7 @@
package roaring
import (
"math/rand"
"reflect"
"testing"
)
@ -110,13 +111,15 @@ func TestUnionSlice(t *testing.T) {
}
func TestMaxInSlice(t *testing.T) {
// arbitrary, we just want to get the same values every time
r := rand.New(rand.NewSource(23))
a := []uint64{1, 4, 9, 5, 24, 13}
v := maxInSlice(a)
if uint64(24) != v {
t.Fatalf("expected %v, but got %v", uint64(24), v)
}
for i := uint64(1000); i <= uint64(100000); i++ {
for i := uint64(1000); i <= uint64(100000); i += uint64(r.Intn(35)) + 1 {
a = append(a, i)
if v = maxInSlice(a); v != i {
t.Fatalf("expected %v, but got %v", i, v)

18
roaring/roaring_test.go
View file

@ -866,7 +866,7 @@ func TestBitmap_UnionInPlaceProp(t *testing.T) {
seed = time.Now().UnixNano()
source = rand.NewSource(seed)
rng = rand.New(source)
numTests = 100
numTests = 20
maxNumIntsPerBatch = 100
maxNumBatches = 100
maxRangePercent = 2
@ -1425,10 +1425,10 @@ func TestBitmap_Shift(t *testing.T) {
}
func TestBitmap_Quick_Array1(t *testing.T) { testBitmapQuick(t, 1000, 1000, 2000) }
func TestBitmap_Quick_Array2(t *testing.T) { testBitmapQuick(t, 10000, 0, 1000) }
func TestBitmap_Quick_Bitmap1(t *testing.T) { testBitmapQuick(t, 10000, 0, 10000) }
func TestBitmap_Quick_Bitmap2(t *testing.T) { testBitmapQuick(t, 10000, 10000, 20000) }
func TestBitmap_Quick_LargeValue(t *testing.T) { testBitmapQuick(t, 10000, 0, math.MaxInt64) }
func TestBitmap_Quick_Array2(t *testing.T) { testBitmapQuick(t, 1000, 0, 1000) }
func TestBitmap_Quick_Bitmap1(t *testing.T) { testBitmapQuick(t, 1000, 0, 10000) }
func TestBitmap_Quick_Bitmap2(t *testing.T) { testBitmapQuick(t, 1000, 10000, 20000) }
func TestBitmap_Quick_LargeValue(t *testing.T) { testBitmapQuick(t, 1000, 0, math.MaxInt64) }
// Ensure a bitmap can perform basic operations on randomly generated values.
func testBitmapQuick(t *testing.T, n int, min, max uint64) {
@ -1504,20 +1504,20 @@ func TestBitmap_Marshal_Quick_Array1(t *testing.T) {
testBitmapMarshalQuick(t, 1000, 1000, 2000, false)
}
func TestBitmap_Marshal_Quick_Array2(t *testing.T) {
testBitmapMarshalQuick(t, 10000, 0, 1000, false)
testBitmapMarshalQuick(t, 1000, 0, 1000, false)
}
func TestBitmap_Marshal_Quick_Bitmap1(t *testing.T) {
testBitmapMarshalQuick(t, 10000, 0, 10000, false)
testBitmapMarshalQuick(t, 1000, 0, 10000, false)
}
func TestBitmap_Marshal_Quick_Bitmap2(t *testing.T) {
testBitmapMarshalQuick(t, 10000, 10000, 20000, false)
testBitmapMarshalQuick(t, 1000, 10000, 20000, false)
}
func TestBitmap_Marshal_Quick_LargeValue(t *testing.T) {
testBitmapMarshalQuick(t, 100, 0, math.MaxInt64, false)
}
func TestBitmap_Marshal_Quick_Bitmap_Sorted(t *testing.T) {
testBitmapMarshalQuick(t, 10000, 0, 10000, true)
testBitmapMarshalQuick(t, 1000, 0, 10000, true)
}
// TODO update for RLE